| Naziv: | Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors |
Autori: | Đorić Veljković, Snežana   ; Živanović, Emilija ; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Ristić, Goran ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel |
Godina: | 2024 |
Publikacija: | Micromachines |
ISSN: | 2072-666X Micromachines Pretraži identifikator |
Izdavač: | MDPI |
Tip rezultata: | Naučni članak |
Kolacija: | vol. 16 br. 1 str. 27-27 |
DOI: | 10.3390/mi16010027 |
WoS-ID: | 001404382600001 |
Scopus-ID: | 2-s2.0-85216126487 |
PMID: | 39858683 |
PMCID: | PMC11767675 |
URI: | https://enauka.gov.rs/handle/123456789/958715 |
Projekat: | European Union's Horizon 2024 research and innovation program [SPS G5974-"High-k Dielectric RADFET]
European Union's Horizon 2024 research and innovation program through the AIDA4Edge Twinning project [101160293]
Ministry of Science, Technological Development and Innovation of the Republic of Serbia [451-03-65/2024-03/200102, 451-03-65/2024-03/200095] |
Izvor metapodataka: | (Preuzeto iz CrossRef-a) Veljković, Sandra |
M-kategorija: | 21M21 - Vodeći međunarodni časopis kategorije M21 |
