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| Issue Date | Title | Author(s) | Type | Мp-cat. |
| 2019 | A Method for Automating the Measurement and Characterization of Electrical Materials | Đorđević, Miloš D.  ; Paunović, Vesna V.  ; Danković, Danijel M. ; Milić Pejović | Conference Paper | |
| 2012 | Afterglow processes responsible for memory effect in nitrogen | Pejović, Milić ; Nešić, N. T.; Pejović, Momčilo ; Živanović, Emilija | Article | |
| 2001 | An aspect of Power and Energy Measurement for Periodical Distorted Signals | Milosavljević, D.; Milenković, Vladeta ; Pejović, Milić ; Đorđevic-Kozarov, Jelena | Conference Paper | |
| 2006 | Analysis of low-pressure dc breakdown in nitrogen between two spherical iron electrodes | Pejovic, Momcilo M; Nesic, Nikola T; Pejovic, Milic M | Article | |
| 2008 | Analysis of neutral active particle loss in afterglow in krypton at 2.6mbar pressure | Pejovic, Momcilo M.; Karamarkovic, Jugoslav P. ; Ristic, Goran S. ; Pejovic, Milic M. | Article | |
| 2010 | Analysis of processes responsible for the memory effect in air at low pressures | Pejović, Momčilo ; Živanović, Emilija ; Pejović, Milić ; Karamarković, Jugoslav | Article | |
| 2011 | Analysis of statistical nature of electrical breakdown time delay in nitrogen at 6.6 mbar pressure in presence of positive ions and N(4S) atoms | Živanović, Emilija ; Pejović, Momčilo ; Pejović, Milić | Article | |
| 2023 | Application of Commercial p-channel Power VDMOS Transistors as Dosimeters for Photon Ionizing Radiation | Pejovic, Milic M | Conference Paper | |
| 2015 | Application of p-Channel Power VDMOSFET as a High Radiation Doses Sensor | Pejović, Milić | Article | |
| 2002 | Characterisation of radiation response of 400 nm implanted gate oxide RADFETs | Jakšić, Aleksandar; Ristić, Goran ; Pejovic, Milić ; Mohammadzadeh, Ali; Lane, William | Conference Paper | |
| 2023 | Commercial voltage indicator as a gamma radiation detector | Pejović, Milić ; Pejović, Svetlana; Živanović, Miloš | Article | |
| 2012 | Contribution of fixed oxide traps to sensitivity of pMOS dosimeters during gamma ray irradiation and annealing at room and elevated temperature | Pejović, Milić ; Pejović, Momčilo ; Jaksic, Aleksandar B. | Article | |
| 2008 | Contribution of statistical time delay and formative time to total electrical breakdown time delay in argon for different afterglow periods | Pejovic, Momcilo M; Pejovic, Milic M | Article | |
| 2017 | Corrigendum to: Effects of ion beam irradiation on nanoscale InOx cooper-pair insulators (International Journal of Photoenergy (2013) 2013 (236823) DOI: 10.1155/2013/236823) | Milosavljevic, Srdjan; Lazarević, Đorđe R.; Stanković, Koviljka ; Pejović, Milić M. ; Vujisić, Miloš Lj. | Other | |
| 2019 | Defects induced by gamma-ray irradiation and post-irradiation annealing and its influence on the threshold voltage of p-channel power VDMOS transistors | Pejovic, Milic M | Article | |
| 2012 | Delay Response of Gas Discharge Tubes | Pejović, Milić ; Pejović, Momčilo ; Marić R.; Timotijević Lj.; Stanković K. | Conference Paper | |
| 2012 | Delay Response of Gas Discharge Tubes, Progress In Electromagnetics Research Symposium, PIERS 2012 | Pejović, Milić ; Pejović, Momčilo ; Stanković, Koviljka ; R. Marić; Lj. Timotijević | Conference Paper | |
| 2017 | Different types of field-effect transistors-theory and application | Pejović, Milić M. ; Pejović, Momčilo M. | Monograph | |
| 2005 | Digital system for vacuum and gas-filled devices testing | Pejovic, Milic M | Article | |
| 2015 | Dose response, radiation sensitivity and signal fading of p-channel MOSFETs (RADFETs) irradiated up to 50 Gy with 60Co | Pejović, Milić | Article | |