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Browsing by Author Ristić, Goran
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| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 1993 | A comparison between thermal annealing and UV‐radiation annealing of γ‐irradiated NMOS transistors | Pejović, Momčilo  ; Ristić, Goran  ; Golubović, Snežana | Article | 23M23 |
| 2022 | A design concept for radiation hardened RADFET readout system for space applications | Anđelković, Marko; Simevski, Aleksandar; Chen, Junchao; Schrape, Oliver; Stamenković, Zoran; Krstić, Miloš; Ilić, Stefan ; Ristić, Goran ; Jakšić, Aleksandar; Vasović, Nikola;
Duane, Russell; Palma, Alberto J.; Lallena, Antonio M.; Carvajal, Miguel A.;
| Article | 21M21 |
| 2012 | A new heating system for thermoluminescence reader | Ristić, Goran ; M.Todorović | Conference Paper | Mp. category will be shown later |
| 2012 | A new microcontroller-based RADFET dosimeter reader | Vasović, Nikola D.; Ristić, Goran | Article | 21M21 |
| 2012 | A pulse mode gamma radiation monitoring system | Anđelković, Marko ; Ristić, Goran | Conference Paper | Mp. category will be shown later |
| 2012 | A switching system based on microcontroller for successive applying of MGT and CPT on MOSFETs | Vasović, Nikola D.; Ristić, Goran | Article | 21M21 |
| 2011 | A system for gas electrical breakdown time delay measurements based on a microcontroller | Todorović, Miomir; Vasović, Nikola D; Ristić, Goran | Article | 21M21 |
| 2012 | An autoranging electrometer for current mode dosimetry | Anđelković, Marko ; Ristić, Goran | Conference Paper | Mp. category will be shown later |
| 2023 | An improved RADFET-based module with an extended dose range of 1 kGy TID based on COTS parts | Vasović, Nikola ; Duane, Russell; Ristić, Goran ; Stanković, Srboljub | Conference Paper | Mp. category will be shown later |
| 2000 | Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay method | Pejovic, Momcilo M; Ristic, Goran S | Article | 21M21 |
| 2002 | Analysis of mechanisms which lead to electrical breakdown in argon using the time delay method | Pejovic, Momcilo M; Ristic, Goran S | Article | 21M21 |
| 2008 | Analysis of neutral active particle loss in afterglow in krypton at 2.6mbar pressure | Pejovic, Momcilo M.; Karamarkovic, Jugoslav P. ; Ristic, Goran S. ; Pejovic, Milic M. | Article | 21M21 |
| 2000 | Analysis of postirradiation annealing of n-channel power vertical double-diffused metal-oxide-semiconductor transistors | Ristic, Goran S ; Pejovic, Momcilo M; Jaksic, Aleksandar B | Article | 21aM21a |
| 2022 | Analysis of Single Event Transient Effects in Standard Delay Cells Based on Decoupling Capacitors | Andjelković, Marko ; Marjanović, Miloš ; Draško, Bojan; Calligaro, Cristiano; Schrape, Oliver; Gatti, Umberto; Kuentzer, Felipe A; Ilić, Stefan ; Ristić, Goran ; Krstić, Miloš | Article | 22M22 |
| 1996 | Analysis of the processes in power MOSFETs during γ-ray irradiation and subsequent thermal annealing | Jakšić, Aleksandar; Ristić, Goran ; Pejović, Momčilo | Article | Mp. category will be shown later |
| 1994 | Annealing of gamma-irradiated Al-gate NMOS transistors | Pejović, Momčilo ; Golubović, Snežana ; Ristić, Goran ; Odalović, Milan | Article | 21M21 |
| 2024 | Assessment of NBT Stressing Impact on the Continuous Operation of Power VDMOS Transistor | Veljković, Sandra ; Mitrović, Nikola ; Živanović, Emilija ; Marjanović, Miloš ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2014 | Automatic and reliable electrical characterization of MOSFETs | Stamenkovic, Z.; Vasovic, N. D.; Ristić, Goran | Conference Paper | Mp. category will be shown later |
| 2023 | Batteryless NFC dosimeter tag for ionizing radiation based on commercial MOSFET | Pousibet-Garrido, A; Escobedo, P; Guirado, D; Ristic, Goran S ; Palma, AJ; Carvajal, MA | Article | 21M21 |
| 2022 | Behaviour of pMOS dosimeters during and after X-rays | Veljković, Sandra ; Ilić, Stefan ; Duane, Russell; Anđelković, Marko ; Palma, Alberto; Ristić, Goran | Conference Paper | Mp. category will be shown later |