eNauka - pregled
Pregled prema Autor Ristić, Goran
Prikaz rezultata 1 do 20 od 152
sledeće >
Godina | Naslov | Autor(i) | Tip rezultata | Mp-kat. |
---|---|---|---|---|
1993 | A comparison between thermal annealing and UV‐radiation annealing of γ‐irradiated NMOS transistors![]() | Pejović, Momčilo ![]() ![]() ![]() ![]() ![]() | Naučni članak | 23M23 - Rad u međ. časopisu |
2022 | A design concept for radiation hardened RADFET readout system for space applications![]() | Anđelković, Marko; Simevski, Aleksandar; Chen, Junchao; Schrape, Oliver; Stamenković, Zoran; Krstić, Miloš; Ilić, Stefan ![]() ![]() ![]() ![]()
Duane, Russell; Palma, Alberto J.; Lallena, Antonio M.; Carvajal, Miguel A.;
| Naučni članak | 21M21 - Rad u vrhunskom međ. časopisu |
2012 | A new heating system for thermoluminescence reader | Ristić, Goran ![]() ![]() | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
2012 | A new microcontroller-based RADFET dosimeter reader | Vasović, Nikola D.; Ristić, Goran ![]() ![]() | Naučni članak | 21M21 - Rad u vrhunskom međ. časopisu |
2012 | A pulse mode gamma radiation monitoring system![]() | Anđelković, Marko ![]() ![]() ![]() | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
2012 | A switching system based on microcontroller for successive applying of MGT and CPT on MOSFETs | Vasović, Nikola D.; Ristić, Goran ![]() ![]() | Naučni članak | 22M22 - Rad u istaknutom međ. časopisu |
2011 | A system for gas electrical breakdown time delay measurements based on a microcontroller | Todorović, Miomir; Vasović, Nikola D; Ristić, Goran ![]() ![]() | Naučni članak | 21M21 - Rad u vrhunskom međ. časopisu |
2012 | An autoranging electrometer for current mode dosimetry![]() | Anđelković, Marko ![]() ![]() ![]() | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
2023 | An improved RADFET-based module with an extended dose range of 1 kGy TID based on COTS parts![]() | Vasović, Nikola ![]() ![]() ![]() ![]() ![]() | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
2000 | Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay method | Pejovic, Momcilo M; Ristic, Goran S ![]() ![]() | Naučni članak | 21M21 - Rad u vrhunskom međ. časopisu |
2002 | Analysis of mechanisms which lead to electrical breakdown in argon using the time delay method | Pejovic, Momcilo M; Ristic, Goran S ![]() ![]() | Naučni članak | 21M21 - Rad u vrhunskom međ. časopisu |
2008 | Analysis of neutral active particle loss in afterglow in krypton at 2.6mbar pressure![]() | Pejovic, Momcilo M.; Karamarkovic, Jugoslav P. ![]() ![]() ![]() ![]() ![]() ![]() | Naučni članak | 21M21 - Rad u vrhunskom međ. časopisu |
2000 | Analysis of postirradiation annealing of n-channel power vertical double-diffused metal-oxide-semiconductor transistors | Ristic, Goran S ![]() ![]() | Naučni članak | 21aM21a - Rad u međ. časopisu izuzetnih vrednosti |
2022 | Analysis of Single Event Transient Effects in Standard Delay Cells Based on Decoupling Capacitors![]() | Andjelković, Marko ![]() ![]() ![]() ![]() ![]() ![]() ![]() | Naučni članak | 23M23 - Rad u međ. časopisu |
1996 | Analysis of the processes in power MOSFETs during γ-ray irradiation and subsequent thermal annealing![]() | Jakšić, Aleksandar; Ristić, Goran ![]() ![]() ![]() | Naučni članak | Mp kategorija će biti prikazana naknadno. |
1994 | Annealing of gamma-irradiated Al-gate NMOS transistors![]() | Pejović, Momčilo ![]() ![]() ![]() ![]() ![]() | Naučni članak | 21M21 - Rad u vrhunskom međ. časopisu |
2024 | Assessment of NBT Stressing Impact on the Continuous Operation of Power VDMOS Transistor![]() | Veljković, Sandra ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() | Conference Paper | Mp. category will be shown later |
2014 | Automatic and reliable electrical characterization of MOSFETs | Stamenkovic, Z.; Vasovic, N. D.; Ristić, Goran ![]() ![]() | Conference Paper | Mp. category will be shown later |
2023 | Batteryless NFC dosimeter tag for ionizing radiation based on commercial MOSFET | Pousibet-Garrido, A; Escobedo, P; Guirado, D; Ristic, Goran S ![]() ![]() | Article | 21M21 |
2022 | Behaviour of pMOS dosimeters during and after X-rays![]() | Veljković, Sandra ![]() ![]() ![]() ![]() ![]() ![]() ![]() | Conference Paper | Mp. category will be shown later |