Researchers
Prijić, Aneta
Type
Date issued
Results 61-80 of 101
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2014 | Kapacitivni senzor pritiska sa višeslojnim dielektrikom - RS 52973 B | Vračar, Ljubomir   ; Dušan Vučković; Prijić, Aneta ; Prijić, Zoran | Patent | Mp. category will be shown later |
| 2014 | Tastatura od programabilnih tastera izrađenih u tehnologiji štampanih ploča i postupak dodeljivanja identifikacione oznake tasterima - RS 52967B | Vračar, Ljubomir ; Vučković, Dušan ; Prijić, Aneta ; Prijić, Zoran | Patent | Mp. category will be shown later |
| 2014 | Taster izrađen u tehnologiji štampanih ploča - RS 52974 B | Vračar, Ljubomir ; Dušan Vučković; Prijić, Aneta ; Prijić, Zoran | Patent | Mp. category will be shown later |
| 2014 | Uvod u poluprovodničke komponente i njihovu primenu | Prijić, Zoran ; Prijić, Aneta | Text book | Mp. category will be shown later |
| 2014 | Recoverable and permanent components of V<inf>T</inf> shift in pulsed NBT stressed p-channel power VDMOSFETs | Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Prijić, Aneta | Conference Paper | Mp. category will be shown later |
| 2014 | A Method for Measuring NBTI Degradation in p-channel Power VDMOSFETs | Prijić, Zoran ; Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2014 | On the Measurement Methods for Dielectric Constant Determination in Nb/BaTiO3 Ceramics | Marjanović, Miloš B. ; Paunović, Vesna V. ; Prijić, Zoran ; Prijić, Aneta ; Danković, Danijel ; Mitić, Vojislav | Conference Paper | Mp. category will be shown later |
| 2014 | Recoverable and Permanent Components of V-T Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs | Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Prijić, Aneta | Conference Paper | Mp. category will be shown later |
| 2014 | Mobilna eksperimentalna postavka za određivanje napona praga VDMOS tranzistora snage | Aleksandar Ilić; Prijić, Zoran ; Prijić, Aneta ; Davidović, Vojkan ; Danković, Danijel ; Stojadinović, Ninoslav D. | Conference Paper | Mp. category will be shown later |
| 2014 | Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors | Stojadinović, Ninoslav ; Manić, Ivica ; Danković, Danijel ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Prijić, Aneta ; Golubović, Snežana ; Prijić, Zoran | Book parts | Mp. category will be shown later |
| 2013 | Naponsko temperaturna naprezanja p-kanalnih VDMOS tranzistora snage | Danković, Danijel ; Prijić, Aneta ; Manić, Ivica Đ. ; Prijić, Zoran ; Stojadinović, Ninoslav D. | Conference Paper | Mp. category will be shown later |
| 2013 | Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav | Article | 23M23 |
| 2013 | Karakterizacija komercijalnih termoelektričnih generatora za primene u samonapajajućim senzorskim sistemima | Dejan Milić; Prijić, Aneta ; Vračar, Ljubomir ; Prijić, Zoran | Conference Paper | Mp. category will be shown later |
| 2013 | Samonapajajući fotonaponski čvor bežične senzorske mreže | Vračar, Ljubomir ; Damir Nešić; Saša Dević; Prijić, Aneta ; Prijić, Zoran | Technical reports | Mp. category will be shown later |
| 2013 | An Electromechanical Approach to a Printed Circuit Board Design Course | Danković, Danijel ; Vračar, Ljubomir ; Prijić, Aneta ; Prijić, Zoran | Article | 22M22 |
| 2012 | A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors | Prijić, Aneta ; Danković, Danijel ; Vračar, Ljubomir ; Manić, Ivica ; Prijić, Zoran ; Stojadinović, Ninoslav | Article | 21M21 |
| 2012 | Measurements of Negative Bias Temperature Instability (NBTI) in p-Channel Power VDMOSFETs | Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Prijić, Zoran ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2012 | Određivanje perioda pouzdanog rada p-kanalnih VDMOS tranzistora snage podvrgnutih kontinualnim i impulsnim NBT naprezanjima | Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav ; Đorić-Veljković, Snežana | Conference Paper | Mp. category will be shown later |
| 2012 | Lifetime estimation in nbt-stressed p-channel power VDMOSFETS | Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav | Article | 53M53 |
| 2012 | Nova metoda za ispitivanje nestabilnosti usled naponsko temperaturnih naprezanja VDMOS tranzistora snage | Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Vračar, Ljubomir M. ; Prijić, Zoran ; Stojadinović, Ninoslav | Technical reports | Mp. category will be shown later |