Researchers
Prijić, Zoran
Results 101-120 of 151
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2014 | On the Measurement Methods for Dielectric Constant Determination in Nb/BaTiO3 Ceramics | Marjanović, Miloš B. | Conference Paper | Mp. category will be shown later |
| 2014 | Mobilna eksperimentalna postavka za određivanje napona praga VDMOS tranzistora snage | Aleksandar Ilić; Prijić, Zoran | Conference Paper | Mp. category will be shown later |
| 2014 | Kapacitivni senzor pritiska sa višeslojnim dielektrikom - RS 52973 B | Vračar, Ljubomir | Patent | Mp. category will be shown later |
| 2014 | Microstructure and dielectric properties of Dy/Mn doped BaTiO3 ceramics![]() | Paunović, Vesna | Article | 21aM21a |
| 2014 | Taster izrađen u tehnologiji štampanih ploča - RS 52974 B | Vračar, Ljubomir | Patent | Mp. category will be shown later |
| 2014 | A Method for Measuring NBTI Degradation in p-channel Power VDMOSFETs | Prijić, Zoran | Conference Paper | Mp. category will be shown later |
| 2014 | Uvod u poluprovodničke komponente i njihovu primenu | Prijić, Zoran | Text book | Mp. category will be shown later |
| 2014 | Recoverable and permanent components of V<inf>T</inf> shift in pulsed NBT stressed p-channel power VDMOSFETs | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2014 | Recoverable and Permanent Components of V-T Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs![]() | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2014 | Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors![]() | Stojadinović, Ninoslav | Book parts | Mp. category will be shown later |
| 2013 | Naponsko temperaturna naprezanja p-kanalnih VDMOS tranzistora snage | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2013 | Karakterizacija komercijalnih termoelektričnih generatora za primene u samonapajajućim senzorskim sistemima | Dejan Milić; Prijić, Aneta | Conference Paper | Mp. category will be shown later |
| 2013 | Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs![]() | Danković, Danijel | Article | 23M23 |
| 2013 | Mikrostrukturna i električna svojstva Ho dopirane BaTiO3 keramike![]() | Marjanović, Miloš | Conference Paper | Mp. category will be shown later |
| 2013 | An Electromechanical Approach to a Printed Circuit Board Design Course | Danković, Danijel | Article | 22M22 |
| 2013 | Samonapajajući fotonaponski čvor bežične senzorske mreže | Vračar, Ljubomir | Technical reports | Mp. category will be shown later |
| 2012 | Određivanje perioda pouzdanog rada p-kanalnih VDMOS tranzistora snage podvrgnutih kontinualnim i impulsnim NBT naprezanjima![]() | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2012 | A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors | Prijić, Aneta | Article | 21M21 |
| 2012 | Capacitive Pressure Sensing Based Key in PCB Technology for Industrial Applications![]() | Vračar, Ljubomir | Article | 21M21 |
| 2012 | Measurements of Negative Bias Temperature Instability (NBTI) in p-Channel Power VDMOSFETs | Danković, Danijel | Conference Paper | Mp. category will be shown later |
