Researchers
Ristić, Goran
Results 21-40 of 161
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2023 | Sensitivity and fading of eight different types of pMOS transistors irradiated to high dose | Veljković, Sandra   ; Duane, Russell; Ristić, Goran | Conference Paper | Mp. category will be shown later |
| 2023 | Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System | Andjelković, Marko ; Chen, Junchao; Syed, Rizwan Tariq; Vargas, Fabian; Ulbricht, Markus; Krstić, Miloš ; Ilić, Stefan ; Marjanović, Miloš ; Veljković, Sandra ; Mitrović, Nikola ;
Danković, Danijel
; Ristić, Goran ; Duane, Russell; Vasović, Nikola; Jakšić, Aleksandar; Palma, Alberto J.; Lallena, Antonio M.; Carvajal, Miguel A.; | Conference Paper | Mp. category will be shown later |
| 2023 | Gain dependence on free carrier concentration in LGADs | Kramberger, G; Hiti, B; Cindro, V; Howard, A; Mandic, I; Mikuz, M; Petek, M; Ristic, Aleksa T; Ristic, Goran S | Article | 22M22 |
| 2023 | Effects of self-heating and NBTI-induced stress on p-channel power VDMOSFETs | Veljković, Sandra ; Mitrović, Nikola ; Jovanović, Igor ; Živanović, Emilija ; Paskaleva, Albena; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2023 | SPICE Modeling of RADFETs with Different Gate Oxide Thicknesses | Marjanović, Miloš ; Gürer, U.; Mitrović, Nikola ; Yilmaz, O.; Danković, Danijel ; Budak, E.; Ristić, Goran ; Yilmaz, Ercan | Conference Paper | Mp. category will be shown later |
| 2023 | Effects in Commercial p-Channel Power VDMOS Transistors Initiated by Negative Bias Temperature Stress and Irradiation | Veljković, Sandra ; Mitrović, Nikola ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Živanović, Emilija ; Stanković, Srboljub ; Anđelković, Marko ; Ristić, Goran ; Paskleva, Albena;
Spassov, Dentcho; Danković, Danijel
; | Conference Paper | Mp. category will be shown later |
| 2023 | Successive irradiation and thermal annealing of commercial p-channel LDMOSFETs | Mitrović, Nikola ; Guirado, Damian; Danković, Danijel ; Palma, Alberto J.; Ristić, Goran ; Carvajal, Miguel A. | Conference Paper | Mp. category will be shown later |
| 2023 | Batteryless NFC dosimeter tag for ionizing radiation based on commercial MOSFET | Pousibet-Garrido, A; Escobedo, P; Guirado, D; Ristic, Goran S ; Palma, AJ; Carvajal, MA | Article | 21M21 |
| 2023 | NFC Implementation Methods for ESP32 Based IoT Systems | Mitrović, Nikola ; Pousibet-Garrido, Antonio; Veljković, Sandra ; Ruiz-Garcia, Isidoro; Danković, Danijel ; Palma, Alberto J.; Ristić, Goran ; Carvajal, Miguel A. | Conference Paper | Mp. category will be shown later |
| 2023 | Using TCAD Simulations to Verify the McWhorter Method for Assessing Trapped Charge in Dielectric | Veljković, Sandra ; Ristić, Goran ; Danković, Danijel ; Palma, Alberto; Andjelković, Marko ; Duane, Russell | Conference Paper | Mp. category will be shown later |
| 2023 | Voltage Glitch Filter and Detector with Self-Checking Capability for FPGA Implementation | Andjelković, Marko ; Syed, R.; Pavlović, M.; Vargas, F.; Nikolić, Tatjana ; Ristić, Goran ; Krstić, M. | Conference Paper | Mp. category will be shown later |
| 2023 | Prediction of Generated Single Event Transient Pulse Width Using Artificial Intelligence Methods | Andjelković, Marko ; Chen, J.; Syed, R. T.; Marjanović, Miloš ; Ristić, Goran ; Krstic, M. | Conference Paper | Mp. category will be shown later |
| 2023 | TCAD validation of McWhorter method for extracting trapped charge in dielectrics | Veljković, Sandra ; Ristić, Goran ; Danković, Danijel ; Duane, Russell | Conference Paper | Mp. category will be shown later |
| 2023 | An improved RADFET-based module with an extended dose range of 1 kGy TID based on COTS parts | Vasović, Nikola ; Duane, Russell; Ristić, Goran ; Stanković, Srboljub | Conference Paper | Mp. category will be shown later |
| 2023 | Consecutive Irradiation and Thermal Annealing of Commercial P-Channel Power VDMOSFETs | Mitrović, Nikola ; Guirado, D.; Danković, Danijel ; Palma, Alberto; Ristić, Goran ; Carvajal, Miguel | Conference Paper | Mp. category will be shown later |
| 2022 | Commercial P-Channel Power VDMOSFET as X-ray Dosimeter | Ristić, Goran ; Ilić, Stefan ; Veljković, Sandra ; Jevtić, Aleksandar ; Dimitrijević, Strahinja; Palma, Alberto; Stanković, Srboljub ; Anđelković, Marko | Article | 22M22 |
| 2022 | Sensitivity and fading of irradiated RADFETs with different gate voltages | Ristić, Goran ; Ilić, Stefan D. ; Andjelković, Marko S.; Duane, Russell; Palma, Alberto J.; Lalena, Antonio M.; Krstić, Miloš; Jaksić, Aleksandar | Article | 22M22 |
| 2022 | Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress | Veljković, Sandra ; Mitrović, Nikola ; Davidović, Vojkan ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Paskaleva, Albena; Spassov, Dencho; Stanković, Srboljub ; Andjelković, Marko ; Prijić, Zoran ;
Manić, Ivica
; Prijić, Aneta ; Ristić, Goran ; Danković, Danijel ; | Article | 22M22 |
| 2022 | Fading of pMOS dosimeters over a long period of time | Ristic, Goran S ; Andjelkovic, Marko S; Duane, Russell; Jaksic, Aleksandar B | Contribution to periodical | 23M23 |
| 2022 | P-channel power VDMOSFETs under the influence of radiation and static/pulsed NBT stress | Veljković, Sandra ; Mitrović, Nikola ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana ; Prijić, Aneta ; Prijić, Zoran ; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |