Researchers
Stanimirović, Zdravko
Type
Issue Date | Title | Author(s) | Type | М-cat. |
---|---|---|---|---|
2009 | Mechanical Properties of MEMS Materials (✓) | Stanimirović, Zdravko ![]() ![]() ![]() ![]() | Book parts | Mp. category will be shown later |
2009 | Reliability of MEMS (✓) | Stanimirović, Ivanka ![]() ![]() ![]() ![]() | Book parts | Mp. category will be shown later |
2008 | Noise and resistance as indicators of HVP stressing impact on performances of conventional TFRs | Stanimirovic, Ivanka P ![]() ![]() ![]() ![]() | Conference Paper | Mp. category will be shown later |
2008 | Simultaneous mechanical and electrical straining of conventional thick-film resistors (✓) | Stanimirović, Zdravko ![]() ![]() ![]() ![]() | Article | 22M22 |
2008 | Analysis of mechanical and electrical straining effects on TFRs - Statistical bimodal conductance approach | Stanimirovic, Zdravko I ![]() ![]() ![]() ![]() | Conference Paper | Mp. category will be shown later |
2007 | Multiple high-voltage pulse stressing of conventional thick-film resistors (✓) | Stanimirović, Ivanka ![]() ![]() ![]() ![]() | Article | 22M22 |
2006 | Performances of conventional thick-film resistors after multiple high-voltage pulse | Stanimirovic, Ivanka P ![]() ![]() ![]() ![]() | Conference Paper | Mp. category will be shown later |
2006 | Influence of simultaneous mechanical and electrical straining on conventional thick-film resistors | Stanimirovic, Zdravko I ![]() ![]() ![]() ![]() | Conference Paper | Mp. category will be shown later |
2005 | Computer simulation of thick-film resistors based on 3D planar RRN model | Stanimirovic, Zdravko I ![]() ![]() ![]() ![]() | Conference Paper | Mp. category will be shown later |
2004 | Performances of conventional thick-film resistors subjected to mechanical straining | Stanimirovic, Zdravko I ![]() ![]() ![]() ![]() | Conference Paper | Mp. category will be shown later |
2003 | High-voltage pulse stressing of thick-film resistors and noise (✓) | Stanimirović, Ivanka ![]() ![]() ![]() ![]() | Article | 22M22 |
2001 | Evaluation of thick-film resistor structural parameters based on noise index measurements (✓) | Jevtić, M. M.; Stanimirović, Zdravko ![]() ![]() ![]() ![]() | Article | 22M22 |