Researchers
Stanimirović, Zdravko
Issue Date | Title | Author(s) | Type | М-cat. |
---|---|---|---|---|
1999 | Low-frequency noise in thick-film resistors due to two-step tunneling process in insulator layer of elemental MIM cell (✓) | Jevtić, M. M.; Stanimirović, Zdravko ; Mrak, I. | Article | 21M21 |
1999 | Thick-film resistor quality indicator based on noise index measurements (✓) | Jevtić, M. M.; Mrak, I.; Stanimirović, Zdravko | Article | 22M22 |
1998 | Low-frequency noise in thick-film structures caused by traps in glass barriers (✓) | Mrak, I.; Jevtić, M. M.; Stanimirović, Zdravko | Article | 23M23 |