Researchers
Veljković, Sandra
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| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2025 | Stress-induced degradation and lifetime estimation in commercial power VDMOS transistors | Danković, Danijel; Mitrović, Nikola   ; Veljković, Sandra ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan | Editorial works | Mp. category will be shown later |