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Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor under Dynamic Stress Conditions
| Title: | Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor under Dynamic Stress Conditions | Authors: | Đorđević, Dunja; Veljkovic, Sandra   ; Ristić, Goran |
Issue Date: | 2025 | Publication: | First RESIST Workshop: Cross-Layer Reliability Assessment of Electronic Systems – RESIST, 5-7 May 2025, Niš, Serbia, p. 27 | Type: | Contribution to periodical | ISBN: | 978-86-6125-285-3  Search Idenfier |
URI: | https://enauka.gov.rs/handle/123456789/1013194 | Metadata source: | (Preuzeto iz ORCID-a) Veljković, Sandra | M-category: | Mp. category will be shown later |
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