Recovery Behavior of VDMOS Transistors under Sequential Irradiation and NBT Stress

Đorić-Veljković, Snežana; Živanović, Emilija; Davidović, Vojkan; Veljković, Sandra; Mitrović, Nikola; Ristić, Goran; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel

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Title:	Recovery Behavior of VDMOS Transistors under Sequential Irradiation and NBT Stress
Authors:	Đorić-Veljković, Snežana ; Živanović, Emilija ; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Ristić, Goran ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel
Issue Date:	2025
Publication:	First RESIST Workshop: Cross-Layer Reliability Assessment of Electronic Systems – RESIST, 5-7 May 2025, Niš, Serbia, p. 20
Type:	Conference Paper
ISBN:	978-86-6125-285-3 Search Idenfier
URI:	https://enauka.gov.rs/handle/123456789/1013196
Metadata source:	(Preuzeto iz ORCID-a) Veljković, Sandra
M-category:	Mp. category will be shown later

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