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Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor After NBT Stress and Relaxation
| Title: | Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor After NBT Stress and Relaxation | Authors: | Đorđević, Dunja; Tasić, Lana; Veselinović, Nevena; Petrović, Marija; Veljković, Sandra   ; Mitrović, Nikola ; Marjanović, Miloš ; Živanović, Emilija ; Ristić, Goran ; Danković, Danijel |
Issue Date: | 2025 | Publication: | 2025 IEEE 34th International Conference on Microelectronics (MIEL) | ISSN: | 2159-1679  Search Idenfier |
Type: | Conference Paper | ISBN: | 979-8-3315-1418-1 Search Idenfier |
Collation: | str. 1-4 | DOI: | 10.1109/miel66332.2025.11261184 | WoS-ID: | 001661593600014 | URI: | https://enauka.gov.rs/handle/123456789/1013198 | Project: | L'Oreal-UNESCO | Metadata source: | (Preuzeto iz CrossRef-a) Veljković, Sandra | M-category: | Mp. category will be shown later |
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