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Investigation of Self-Heating Effects in Power VDMOS Transistors Subjected to different Pre-Stress Conditions
| Title: | Investigation of Self-Heating Effects in Power VDMOS Transistors Subjected to different Pre-Stress Conditions | Authors: | Živanović, Emilija   ; Veljkovic, Sandra |
Issue Date: | 2025 | Publication: | Second RESIST Workshop: Cross-Layer Reliability Assessment of Electronic Systems – RESIST, June 30th and July 1st 2025, Frankfut Oder, Germany, p. 11 | Type: | Contribution to periodical | URI: | https://enauka.gov.rs/handle/123456789/1013199 | Metadata source: | (Preuzeto iz ORCID-a) Veljković, Sandra | Availability note: | Подаци и/или пуни текст су непотпуни | M-category: | Mp. category will be shown later |
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