Impact of Bias Temperature Stress, Irradiation and Self-Heating Effects on p-Channel Power VDMOS Transistors

Veljković, Sandra; Mitrović, Nikola; Marjanović, Miloš; Živanović, Emilija; Davidović, Vojkan; Ristić, Goran; Danković, Danijel

Results

eNauka > Results > Impact of Bias Temperature Stress, Irradiation and Self-Heating Effects on p-Channel Power VDMOS Transistors

Title:	Impact of Bias Temperature Stress, Irradiation and Self-Heating Effects on p-Channel Power VDMOS Transistors
Authors:	Veljković, Sandra ; Mitrović, Nikola ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel
Issue Date:	2025
Publication:	First TAICHIP Winter School: Reliable Hardware Infrastructure for Upcoming AI Chips, 10-12 February, Germany, 2025, p. 22.
Type:	Contribution to periodical
URI:	https://enauka.gov.rs/handle/123456789/1013200
Metadata source:	(Preuzeto iz ORCID-a) Veljković, Sandra
Availability note:	Подаци и/или пуни текст су непотпуни
M-category:	Mp. category will be shown later

Find the DOI

Finding a DOI in CrossRef based on publication meta-data. The DOI (and metadata) with the similar data match will be displayed. ATTENTION - it doesn't have to be that publication.