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Reliability Issues of Thick-Film Resistors in Embedded Piezoelectric Smart Aggregates for Strain Monitoring
| Title: | Reliability Issues of Thick-Film Resistors in Embedded Piezoelectric Smart Aggregates for Strain Monitoring | Authors: | Stanimirović, Ivanka   ; Stanimirović, Pavle; Stanimirović, Zdravko |
Issue Date: | 2025 | Publication: | 2025 IEEE 34th International Conference on Microelectronics (MIEL) | Publisher: | IEEE | Type: | Conference Paper | ISBN: | 979-8-3315-1418-1  Search Idenfier |
Collation: | str. 1-4 | DOI: | 10.1109/miel66332.2025.11261034 | WoS-ID: | 001661593600010 | Scopus-ID: | 2-s2.0-105030340908 | URI: | https://vinar.vin.bg.ac.rs/handle/123456789/15982 https://enauka.gov.rs/handle/123456789/1014869 |
Metadata source: | (Preuzeto iz CrossRef-a) Stanimirović, Zdravko | M-category: | Mp. category will be shown later |
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