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eNauka >  Results >  Short-term Recovery Effect in a Power Integrated Circuit Exposed to X-Rays
Title: Short-term Recovery Effect in a Power Integrated Circuit Exposed to X-Rays
Authors: Vukić, V. Dj.  
Issue Date: 2023
Publication: 2023 IEEE 33rd International Conference on Microelectronics (MIEL)
Type: Conference Paper
ISBN: 979-8-3503-4776-0 Search Idenfier
Collation: str. 1-6
DOI: 10.1109/miel58498.2023.10315805
WoS-ID: 001701718400034
Scopus-ID: 2-s2.0-85183831855
URI: https://enauka.gov.rs/handle/123456789/1022697
Metadata source: (Preuzeto iz CrossRef-a) Vukić, Vladimir
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