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| Title: | Short-term Recovery Effect in a Power Integrated Circuit Exposed to X-Rays | Authors: | Vukić, V. Dj.   |
Issue Date: | 2023 | Publication: | 2023 IEEE 33rd International Conference on Microelectronics (MIEL) | Type: | Conference Paper | ISBN: | 979-8-3503-4776-0  Search Idenfier |
Collation: | str. 1-6 | DOI: | 10.1109/miel58498.2023.10315805 | Scopus-ID: | 2-s2.0-85183831855 | URI: | https://enauka.gov.rs/handle/123456789/1022697 | Metadata source: | (Preuzeto iz CrossRef-a) Vukić, Vladimir | M-category: | Mp. category will be shown later |
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