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Title: NBTI and Radiation Related Degradation and Lifetime Estimation in Power VDMOSFETs
Authors: Stojadinović, Ninoslav D. 
Issue Date: 2017
Publication: Proc. IEEE Summer School Nanoelectronic technologies & devices: From basic principle to highly reliable application
Publisher: Toulouse
Type: Conference Paper
Collation: vol. 2 str. 71-92
URI: https://enauka.gov.rs/handle/123456789/141117
Metadata source: Migrirano iz RIS podataka
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