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Negative Bias Temperature Instability in p-Channel Power VDMOSFETs Under Pulsed Bias Stress
| Title: | Negative Bias Temperature Instability in p-Channel Power VDMOSFETs Under Pulsed Bias Stress | Authors: | Manić, Ivica   ; Danković, Danijel ; Đorić-Veljković, Snežana ; Prijić, Aneta ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav |
Issue Date: | 2010 | Publication: | Proceedings of 10th International Seminar on Power Semiconductors (ISPS 2010) | Publisher: | Prague, Czech Republic : Czech Technical University in Prague | Type: | Conference Paper | ISBN: | 978-80-01-04602-9  Search Idenfier |
Collation: | str. 173-178 | URI: | https://enauka.gov.rs/handle/123456789/146705 | URL: | http://technology.feld.cvut.cz:8080/xwiki/bin/view/ISPS2010/ | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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