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Determination atomic percentage of metal in chalcogenide Ag-As2Ch3 thin layers by rutherford backscattering spectrometry and energy dispersive spectroscopy
| Title: | Determination atomic percentage of metal in chalcogenide Ag-As2Ch3 thin layers by rutherford backscattering spectrometry and energy dispersive spectroscopy | Authors: | Čajko, Kristina O.   ; Lukić Petrović, Svetlana R. ; Nevena Ćelić; Pavol Noga; Dušan Vana |
Issue Date: | 2019 | Publication: | 3rd International Conference on Applied Surface Science, 3rd International Conference on Applied Surface Science (ICASS 2019), Pisa, Italy, 2019, 17-20.06.2019., No 3 | Publisher: | Elsevier, Pisa, Italy | Type: | Conference Paper | Collation: | str. P1.022-P1.022 | URI: | https://enauka.gov.rs/handle/123456789/175600 https://www.elsevier.com/events/conferences/international-conference-on-applied-surface-science https://www.cris.uns.ac.rs/record.jsf?recordId=110982&source=eNauka&language=en |
URL: | https://www.elsevier.com/events/conferences/international-conference-on-applied-surface-science | Metadata source: | Migracija | M-category: | Mp. category will be shown later |
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