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Measurements of Negative Bias Temperature Instability (NBTI) in p-Channel Power VDMOSFETs
| Title: | Measurements of Negative Bias Temperature Instability (NBTI) in p-Channel Power VDMOSFETs | Authors: | Danković, Danijel   ; Prijić, Aneta ; Manić, Ivica ; Prijić, Zoran ; Stojadinović, Ninoslav |
Issue Date: | 2012 | Publication: | Proceedings of 11th International Seminar on Power Semiconductors (ISPS 2012), Prague | Publisher: | Czech Technical University in Prague, Czech Republic | Type: | Conference Paper | ISBN: | 978-80-01-05100-9  Search Idenfier |
Collation: | str. 240-245 | URI: | https://enauka.gov.rs/handle/123456789/187594 | URL: | http://technology.feld.cvut.cz/ISPS2012 | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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