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Recovery Treatment Effects on Gamma Radiation Response in Electrically Stressed Power VDMOS Transistors
| Title: | Recovery Treatment Effects on Gamma Radiation Response in Electrically Stressed Power VDMOS Transistors | Authors: | Đorić-Veljković, Snežana   ; Davidović, Vojkan ; Danković, Danijel ; Manić, Ivica ; Golubović, Snežana ; Stojadinović, Ninoslav |
Issue Date: | 2014 | Publication: | 2014 29TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS PROCEEDINGS - MIEL 2014 | ISSN: | 2159-1660  Search Idenfier |
Publisher: | Belgrade, Serbia : IEEE | Type: | Conference Paper | ISBN: | Electronic ISBN : 978-1-4799-5296-0; Print ISBN : 978-1-4799-5295-3 ИСБН није валидан Search Idenfier |
Collation: | str. 293-296 | DOI: | 10.1109/miel.2014.6842146 | WoS-ID: | 000360788600062 | Scopus-ID: | 2-s2.0-84904697180 | URI: | https://enauka.gov.rs/handle/123456789/190922 | Metadata source: | Migracija | M-category: | Mp. category will be shown later |
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