Results

eNauka >  Results >  TEM study of basal-plane inversion boundaries in Sn‐Doped ZnO
Title: TEM study of basal-plane inversion boundaries in Sn‐Doped ZnO
Authors: Ribić, Vesna R. ; A. Rečnik; G. Dražić; M. Komelj; A. Kokalj; M. Podlogar; N. Daneu; S. Bernik; T. Radošević; Luković Golić, Danijela T.  ;
Branković, Zorica M.  ; Branković, Goran O.  ;
Issue Date: 2017
Publication: 13th Multinational Congress on Microscopy, Rovinj, Croatia, 2017
Publisher: Ruđer Bošković Institute and Croatian Microscopy Society, Rovinj (Croatia)
Type: Conference Paper
ISBN: 978-953-7941-19-2 Search Idenfier
Collation: str. 471-473
URI: https://enauka.gov.rs/handle/123456789/203048
http://rimsi.imsi.bg.ac.rs/handle/123456789/2463
https://mcm2017.irb.hr
URL: https://mcm2017.irb.hr
Metadata source: Migracija
M-category: 
Mp. category will be shown later

Find the DOI

Google ScholarTM

Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.