Results
| Title: | A Method for Measuring NBTI Degradation in p-channel Power VDMOSFETs | Authors: | Prijić, Zoran   ; Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Stojadinović, Ninoslav |
Issue Date: | 2014 | Publication: | Proc. 50th International Conference on Microelectronics, Devices and Materials (MIDEM 2014) | Publisher: | MIDEM Society, Ljubljana, Slovenija | Type: | Conference Paper | ISBN: | 978-961-92933-4-8  Search Idenfier |
Collation: | str. 9-16 | URI: | https://enauka.gov.rs/handle/123456789/209898 | URL: | http://www.midem-drustvo.si/conf2014 | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
Google ScholarTM
Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.