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Modeling and PSPICE Simulation of Radiation Stress Influence on Threshold Voltage Shifts in P-Channel Power VDMOS Transistors
Title  : | Modeling and PSPICE Simulation of Radiation Stress Influence on Threshold Voltage Shifts in P-Channel Power VDMOS Transistors | Authors: | Marjanović, Miloš   ; Danković, Danijel ; Davidović, Vojkan ; Prijić, Aneta ; Stojadinović, Ninoslav D. ; Prijić, Zoran ; Janković, Nebojša D. |
Issue Date: | 2015 | Publication: | RAD 2015: THE THIRD INTERNATIONAL CONFERENCE ON RADIATION AND APPLICATIONS IN VARIOUS FIELDS OF RESEARCH | Publisher: | RAD Association, Montenegro | Type: | Conference Paper | ISBN: | 978-86-80300-01-6  Search Idenfier |
Collation: | str. 405-408 | WoS-ID: | 000387979700083 | URI: | http://www.rad-conference.org https://enauka.gov.rs/handle/123456789/233485 |
URL: | http://www.rad-conference.org | Metadata source: | Migracija | M-category: | Mp. category will be shown later |
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