Microscopic Properties of the SiO2/Si Interface Growth Based on Numerical Simulations

Stosic, Borko D.; da Silva, Jr., Eronides F.

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Title:	Microscopic Properties of the SiO2/Si Interface Growth Based on Numerical Simulations
Authors:	Stosic, Borko D.; da Silva, Jr., Eronides F.
Issue Date:	1997
Publication:	Brazilian Journal of Physics
ISSN:	0103-9733 Brazilian Journal of Physics Search Idenfier 1678-4448 Brazilian Journal of Physics Search Idenfier
Type:	Article
Collation:	vol. 27 br. 2 str. 325-333
WoS-ID:	000208952700029
URI:	https://vinar.vin.bg.ac.rs/handle/123456789/2736 https://enauka.gov.rs/handle/123456789/243990
Project:	Conselho Nacional de Desenvolvimento Cientifico e Tecnologico (CNPq), Financiadora de Estudos e Projetos (FINEP)
M-category:	Mp. category will be shown later

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