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eNauka >  Rezultati >  A method for separating the effects of interface from border and oxide trapped charge densities in MOS transistors
Naziv: A method for separating the effects of interface from border and oxide trapped charge densities in MOS transistors
Autori: Savić, Z; Radjenovic, B
Godina: 1997
Publikacija: Microelectronics and Reliability
ISSN: 0026-2714 Microelectronics Reliability Pretraži identifikator
Tip rezultata: Naučni članak
Kolacija: vol. 37 br. 7 str. 1147-1150
DOI: 10.1016/S0026-2714(96)00277-6
WoS-ID: A1997WY85100019
Scopus-ID: 2-s2.0-0031191049
URI: https://enauka.gov.rs/handle/123456789/249856
https://vinar.vin.bg.ac.rs/handle/123456789/2061
M-kategorija: 
23M23 - Međunarodni časopis kategorije M23

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