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Low‐Frequency Noise and Resistance as Reliability Indicators of Mechanically and Electrically Strained Thick‐Film Resistors
| Title: | Low‐Frequency Noise and Resistance as Reliability Indicators of Mechanically and Electrically Strained Thick‐Film Resistors | Authors: | Stanimirović, Zdravko   |
Issue Date: | 2017 | Publication: | System Reliability | Publisher: | IntechOpen | Type: | Book parts | ISBN: | 978-953-51-3706-1  Search Idenfier |
Collation: | str. 221-237 | DOI: | 10.5772/intechopen.69441 | URI: | https://enauka.gov.rs/handle/123456789/266988 | Metadata source: | Migrirano iz RIS podataka | Note: | Chapter 12 | M-category: | 14  MNO za elektrotehniku, telekomunikacije i informacione tehnologije (31.03.2022.)M14 |
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