Results
eNauka >
Rezultati >
Defect generation in non-nitrided and nitrided sputtered gate oxides under post-irradiation Fowler-Nordheim constant current stress
| Naziv: | Defect generation in non-nitrided and nitrided sputtered gate oxides under post-irradiation Fowler-Nordheim constant current stress | Autori: | Jelenkovic, Emil V.; Kovcevic, Milojko  ; Jha, S.; Tong, K. Y.; Nikezić, Dragoslav |
Godina: | 2013 | Publikacija: | Microelectronic Engineering | ISSN: | 0167-9317 Microelectronic Engineering Pretraži identifikator |
Tip rezultata: | Naučni članak | Kolacija: | vol. 104 str. 90-94 | DOI: | 10.1016/j.mee.2012.10.016 | WoS-ID: | 000315245000017 | Scopus-ID: | 2-s2.0-84872400570 | URI: | https://enauka.gov.rs/handle/123456789/277032 https://scidar.kg.ac.rs/handle/123456789/10373 https://vinar.vin.bg.ac.rs/handle/123456789/5323 |
Projekat: | Hong Kong Polytechnic University, Ministry of Science and Technology Development of Republic of Serbia [04311] | M-kategorija: | 21M21 - Vodeći međunarodni časopis kategorije M21 |
Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.