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NBT stress and radiation related degradation and underlying mechanisms in power VDMOSFETs
| Title: | NBT stress and radiation related degradation and underlying mechanisms in power VDMOSFETs | Authors: | Davidović, Vojkan   ; Danković, Danijel ; Golubović, Snežana ; Đorić Veljković, Snežana ; Manić, Ivica ; Prijić, Zoran ; Prijić, Aneta ; Stojadinović, Ninoslav ; Stankovic, Srboljub |
Issue Date: | 2018 | Publication: | Facta universitatis - series: Electronics and Energetics | ISSN: | 0353-3670 Facta Universitatis: Series Electronics and Energetics Search Idenfier |
Publisher: | Niš, Serbia : University of Niš | Type: | Article | Collation: | vol. 31 br. 3 str. 367-388 | DOI: | 10.2298/fuee1803367d | WoS-ID: | 000435452500003 | URI: | https://enauka.gov.rs/handle/123456789/279017 https://vinar.vin.bg.ac.rs/handle/123456789/12131 |
Project: | Развој, оптимизација и примена технологија самонапајајућих сензора Карактеризација, анализа и моделовање физичких појава у танким слојевима за примену у MOS нанокомпонентама |
Metadata source: | Migracija | M-category: | 24M24 |
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