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| Title: | Automatic and reliable electrical characterization of MOSFETs | Authors: | Stamenkovic, Z.; Vasovic, N. D.; Ristić, Goran   |
Issue Date: | 2014 | Publication: | 17th International Symposium on Design and Diagnostics of Electronic Circuits and Systems | Type: | Conference Paper | DOI: | 10.1109/ddecs.2014.6868804 | WoS-ID: | 000346734200054 | Scopus-ID: | 2-s2.0-84938778243 | URI: | https://enauka.gov.rs/handle/123456789/287431 | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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