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eNauka >  Results >  Instabilities in p-channel power VDMOSFETs subjected to pulsed negative bias temperature stressing
Title: Instabilities in p-channel power VDMOSFETs subjected to pulsed negative bias temperature stressing
Authors: Danković, Danijel  ; Prijić, Aneta  ; Manić, Ivica  ; Davidović, Vojkan  ; Golubović, Snežana ; Stojadinović, Ninoslav ; Đorić-Veljković, Snežana  
Issue Date: 2010
Publication: Elektronski zbornik radova 54. konferencije ETRAN
Publisher: Beograd : ETRAN
Type: Conference Paper
ISBN: 978-86-80509-65-5 Search Idenfier
Collation: str. MO1.1-1-MO1.1-4
URI: https://enauka.gov.rs/handle/123456789/288855
URL: http://etran.etf.rs/etran2010/Program_ETRAN_2010.pdf
Metadata source: Migrirano iz RIS podataka
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