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Micro-metric electronic patterning of a topological band structure using a photon beam
| Title: | Micro-metric electronic patterning of a topological band structure using a photon beam | Authors: | Frantzeskakis, E.; De, Jong N.; Zwartsenberg, B.; Huang, Y. K.; Bay, T. V.; Pronk, P.; Van, Heumen E.; Wu, D.; Pan, Y.; Radović, Milan |
Issue Date: | 2015 | Publication: | Scientific Reports | ISSN: | 2045-2322 Scientific Reports Search Idenfier |
Type: | Article | Collation: | vol. 5 br. 1 | DOI: | 10.1038/srep16309 | WoS-ID: | 000364213100001 | Scopus-ID: | 2-s2.0-84946762520 | PMID: | 26543011 | PMCID: | PMC4635360 | URI: | https://enauka.gov.rs/handle/123456789/289185 | Metadata source: | Migrirano iz RIS podataka | M-category: | 21aM21a |
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