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еНаука >  Резултати >  SEM – EDS analysis and microindentation hardness study of Zr doped X2Y3 (X = Bi, Sb; Y = Te, Se) p – type semiconductor
Title: SEM – EDS analysis and microindentation hardness study of Zr doped X2Y3 (X = Bi, Sb; Y = Te, Se) p – type semiconductor
Authors: Požega, Emina  ; Ivana Marković  ; Nikola Vuković  
Issue Date: 2013
Publication: 45th International October Conference on Mining and Metallurgy
Publisher: Tehnički fakultet u Boru, Institut za rudarstvo i metalurgiju Bor, Srbija
Type: Conference Paper
ISBN: 978-86-6305-012-9 Search Idenfier
Collation: str. 600-603
URI: https://enauka.gov.rs/handle/123456789/294576
URL: http://www.ioc.tf.bor.ac.rs/images/sampledata/ioc2013/final_program_ioc_2013.pdf
Metadata source: Migrirano iz RIS podataka
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