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| Title: | Sensitivity of pMOS dosimeters with various gate oxide thickness | Authors: | Marko Anđelković; Ristić, Goran   ; A. B. Jaksic |
Issue Date: | 2012 | Publication: | Proceedings of the First International Conference on Radiation and Dosimetery in Various Fields of Researh (RAD 2012) | Publisher: | Elektronski fakultet, Univerzitet u Nisu, Srbija | Type: | Conference Paper | ISBN: | 978-86-6125-063-7  Search Idenfier |
Collation: | vol. 1 br. 1 str. 125-128 | URI: | https://enauka.gov.rs/handle/123456789/294622 | URL: | https://www.rad2012.elfak.rs | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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