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eNauka >  Results >  Simulation of semiconductor bulk trap influence on the electrical characteristics of the n-channel power VDMOS transistor
Title: Simulation of semiconductor bulk trap influence on the electrical characteristics of the n-channel power VDMOS transistor
Authors: Pantić, Dragan  ; Aleksić, Sanja  ; Pešić, Biljana 
Issue Date: 2013
Publication: Informacije MIDEM Journal of Microelectronics, Electronics Components and Materials
ISSN: 0352-9045 Informacije Midem. Journal of Microelectronics, Electric Components and Materials Search Idenfier
Type: Article
Collation: vol. 24 br. 2 str. 124-230
WoS-ID: 000320715700007
URI: https://enauka.gov.rs/handle/123456789/304006
Metadata source: Migrirano iz RIS podataka
M-category: 
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