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| Title: | A review of pulsed NBTI in P-channel power VDMOSFETs | Authors: | Danković, Danijel   ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Prijić, Zoran ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Paskaleva, A.; Spassov, D.; Stojadinović, Ninoslav |
Issue Date: | 2018 | Publication: | Microelectronics Reliability | ISSN: | 0026-2714 Microelectronics Reliability Search Idenfier |
Publisher: | United Kingdom : Elsevier Ltd. | Type: | Article | Collation: | vol. 82 str. 28-36 | DOI: | 10.1016/j.microrel.2018.01.003 | WoS-ID: | 000428825600004 | Scopus-ID: | 2-s2.0-85044346240 | URI: | https://enauka.gov.rs/handle/123456789/334914 | Metadata source: | Migrirano iz RIS podataka | M-category: | 22M22 |
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