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eNauka >  Results >  Self consistent fitting method for defect analysis by low-frequency noise measurements in reverse biased p-n junctions
Title: Self consistent fitting method for defect analysis by low-frequency noise measurements in reverse biased p-n junctions
Authors: Jevtic, MM; Lazovic, MV
Issue Date: 1997
Publication: Solid-state Electronics
ISSN: 0038-1101 Solid-state Electronics Search Idenfier
Type: Article
Collation: vol. 41 br. 8 str. 1127-1131
DOI: 10.1016/S0038-1101(97)00058-0
WoS-ID: A1997XM75200011
Scopus-ID: 2-s2.0-0031210490
URI: https://enauka.gov.rs/handle/123456789/335155
https://vinar.vin.bg.ac.rs/handle/123456789/2077
M-category: 
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