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Title: Measurement of the dielectric properties of SiO2 wafers using optical spectroscopy
Authors: Milosavljević, Vladimir  ; Popović, Dušan  ; A. Zekic
Issue Date: 2010
Publication: AVS 57th International Symposium & Exhibition 2010
Publisher: AVS, Albuquerque, New Mexico, USA
Type: Conference Paper
Collation: str. 118-118
URI: https://enauka.gov.rs/handle/123456789/337382
Metadata source: Migrirano iz RIS podataka
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