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eNauka >  Results >  Spice modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs
Title: Spice modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs
Authors: Janković, Nebojša ; Pesic-Brdjanin, Tatjana
Issue Date: 2015
Publication: Journal of Computational Electronics
ISSN: 1569-8025 Journal of Computational Electronics Search Idenfier
Type: Article
Collation: vol. 14 br. 3 str. 844-851
DOI: 10.1007/s10825-015-0721-1
WoS-ID: 000358655300019
Scopus-ID: 2-s2.0-84938286830
URI: https://enauka.gov.rs/handle/123456789/344644
Metadata source: Migrirano iz RIS podataka
M-category: 
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