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Spice modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs
| Naziv: | Spice modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs | Autori: | Janković, Nebojša  ; Pesic-Brdjanin, Tatjana |
Godina: | 2015 | Publikacija: | Journal of Computational Electronics | ISSN: | 1569-8025 Journal of Computational Electronics Pretraži identifikator |
Tip rezultata: | Naučni članak | Kolacija: | vol. 14 br. 3 str. 844-851 | DOI: | 10.1007/s10825-015-0721-1 | WoS-ID: | 000358655300019 | Scopus-ID: | 2-s2.0-84938286830 | URI: | https://enauka.gov.rs/handle/123456789/344644 | Izvor metapodataka: | Migrirano iz RIS podataka | M-kategorija: | 22M22 - Međunarodni časopis kategorije M22 |
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