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eNauka >  Results >  Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET
Title: Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET
Authors: Danković, Danijel  ; Stojadinović, Ninoslav ; Prijić, Zoran  ; Manić, Ivica  ; Davidović, Vojkan  ; Prijić, Aneta  ; Đorić-Veljković, Snežana  ; Golubović, Snežana 
Issue Date: 2015
Publication: CHINESE PHYSICS B
ISSN: 1674-1056 Chinese Physics B Search Idenfier
Publisher: China : IOP Publishing on behalf of the Chinese Physical Society
Type: Article
Collation: vol. 24 br. 10 str. 106601-106601
DOI: 10.1088/1674-1056/24/10/106601
WoS-ID: 000363327400061
Scopus-ID: 2-s2.0-84947483914
URI: https://enauka.gov.rs/handle/123456789/359649
Project: Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026]
Ei PCB Factory, Nis
Metadata source: Migracija
M-category: 
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