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Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET
| Title: | Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET | Authors: | Danković, Danijel |
Issue Date: | 2015 | Publication: | CHINESE PHYSICS B | ISSN: | 1674-1056 Chinese Physics B Search Idenfier |
Publisher: | China : IOP Publishing on behalf of the Chinese Physical Society | Type: | Article | Collation: | vol. 24 br. 10 str. 106601-106601 | DOI: | 10.1088/1674-1056/24/10/106601 | WoS-ID: | 000363327400061 | Scopus-ID: | 2-s2.0-84947483914 | URI: | https://enauka.gov.rs/handle/123456789/359649 | Project: | Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026] Ei PCB Factory, Nis |
Metadata source: | Migracija | M-category: | 22M22 |
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