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Title: Influence of the patch field on work function measurements based on the secondary electron emission
Authors: Bundaleski, Nenad  ; Trigueiro, J.; Silva, A. G.; Moutinho, A. M. C.; Teodoro, O. M. N. D.
Issue Date: 2013
Publication: Journal of Applied Physics
ISSN: 0021-8979 Journal of Applied Physics Search Idenfier
Type: Article
Collation: vol. 113 br. 18 str. 183720-183720
DOI: 10.1063/1.4804663
WoS-ID: 000319294100053
Scopus-ID: 2-s2.0-84878098446
URI: https://enauka.gov.rs/handle/123456789/375654
Metadata source: Migrirano iz RIS podataka
M-category: 
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