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Electrical and Charge Trapping Properties of HfO2/Al2O3 Multilayer Dielectric Stacks
| Title: | Electrical and Charge Trapping Properties of HfO2/Al2O3 Multilayer Dielectric Stacks | Authors: | Davidović, Vojkan S.   ; A. Paskaleva; D. Spassov; E. Guziewicz; T. Krajewski; Golubović, Snežana M. ; Đorić-Veljković, Snežana M. ; Manić, Ivica Đ. ; Danković, Danijel M. ; Stojadinović, Ninoslav D. |
Issue Date: | 2017 | Publication: | 2017 IEEE 30TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL) | ISSN: | 2159-1660  Search Idenfier |
Publisher: | Niš, Srbija : IEEE Electron Devices Society | Type: | Conference Paper | ISBN: | 978-1-5386-2561-3 Search Idenfier |
Collation: | vol. 1 br. 1 str. 143-146 | DOI: | 10.1109/MIEL.2017.8190088 | WoS-ID: | 000427499000029 | Scopus-ID: | 2-s2.0-85043587212 | URI: | https://enauka.gov.rs/handle/123456789/379274 | Project: | SASA [F-148] | Metadata source: | Migracija | M-category: | Mp. category will be shown later |
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