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Determination of the Etching Rate from the Silicon Symmetry Properties by Extension of the Level Set Method
| Naziv: | Determination of the Etching Rate from the Silicon Symmetry Properties by Extension of the Level Set Method | Autori: | Radmilović-Rađenović, Marija   ; Rađenović, Branislav |
Godina: | 2011 | Publikacija: | International Review of Electrical Engineering / IREE | ISSN: | 1827-6660 International Review of Electrical Engineering / IREE Pretraži identifikator |
Izdavač: | Praise Worthy Prize | Tip rezultata: | Naučni članak | Kolacija: | vol. 5 br. 3 str. 1045-1052 | WoS-ID: | 000280934900028 | URI: | https://enauka.gov.rs/handle/123456789/395157 | URL: | http://www.praiseworthyprize.org/jsm/?journal=iree | Izvor metapodataka: | Migrirano iz RIS podataka | M-kategorija: | 22M22 - Međunarodni časopis kategorije M22 |
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