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eNauka >  Results >  Yield Modeling for Error Tolerant and Partially Defect Tolerant Arrays
Title: Yield Modeling for Error Tolerant and Partially Defect Tolerant Arrays
Authors: Ćirić, Vladimir  ; Simić, Vladimir ; Milentijević, Ivan  
Issue Date: 2012
Publication: IEEE 19th International Conference and Workshops on Engineering of Computer-Based Systems
Publisher: IEEE, Novi Sad, Serbia
Type: Conference Paper
ISBN: 978-0-7695-4664-3 Search Idenfier
Collation: str. 182-187
DOI: 10.1109/ECBS.2012.50
WoS-ID: 000308965100024
Scopus-ID: 2-s2.0-84862083279
URI: https://enauka.gov.rs/handle/123456789/401619
URL: http://tab.computer.org/ecbs/2012/organization.html
Metadata source: Migrirano iz RIS podataka
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