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| Title: | TCAD analiza HEFS degradacije električnih karakteristika nkanalnog VDMOSFET-a | Authors: | Pantić, Dragan   ; Aleksić, Sanja ; Pešić, Biljana |
Issue Date: | 2013 | Publication: | ETRAN 2013 | Publisher: | Serbia | Type: | Conference Paper | URI: | https://enauka.gov.rs/handle/123456789/429822 | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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