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Title: The Influence of Interface and Semiconductor Bulk Traps Generated Under HEFS on MOSFET`s Electrical Characteristics
Authors: Pantić, Dragan  ; Aleksić, Sanja  ; Danijela Pantić
Issue Date: 2014
Publication: 5th Small Systems Simulation Symposium 2014
Publisher: Faculty of Electronic Engineering, University of Niš, Serbia
Type: Conference Paper
ISBN: 978-86-6125-006-4 Search Idenfier
Collation: str. 59-64
URI: https://enauka.gov.rs/handle/123456789/430085
URL: http://jds.elfak.ni.ac.rs/ssss2014/
Metadata source: Migrirano iz RIS podataka
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