Rezultati
| Title: | Annealing of radiation-induced defects in burn-in stressed power VDMOSFETs | Authors: | Đorić-Veljković, Snežana   ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav |
Issue Date: | 2011 | Publication: | Nuclear Technology & Radiation Protection | ISSN: | 1451-3994 Nuclear technology and radiation protection Search Idenfier |
Publisher: | Belgrade : Vinča Institute of Nuclear Sciences | Type: | Article | Collation: | vol. 26 br. 1 str. 18-24 | DOI: | 10.2298/NTRP1101018D | WoS-ID: | 000290121000003 | Scopus-ID: | 2-s2.0-79958218364 | VBS COBISS: | 40361487 | URI: | https://enauka.gov.rs/handle/123456789/432682 http://vbs.rs/scripts/cobiss?command=DISPLAY&base=70036&RID=40361487 https://plus.cobiss.net/cobiss/sr/sr/bib/40361487#izum.si |
Project: | Ministry of Science and Technological Development of Republic of Serbia | M-category: | 22M22 |
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