Results
| Naziv: | Annealing of radiation-induced defects in burn-in stressed power VDMOSFETs | Autori: | Đorić-Veljković, Snežana   ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav |
Godina: | 2011 | Publikacija: | Nuclear Technology & Radiation Protection | ISSN: | 1451-3994 Nuclear technology and radiation protection Pretraži identifikator |
Izdavač: | Belgrade : Vinča Institute of Nuclear Sciences | Tip rezultata: | Naučni članak | Kolacija: | vol. 26 br. 1 str. 18-24 | DOI: | 10.2298/NTRP1101018D | WoS-ID: | 000290121000003 | Scopus-ID: | 2-s2.0-79958218364 | VBS COBISS: | 40361487 | URI: | https://enauka.gov.rs/handle/123456789/432682 http://vbs.rs/scripts/cobiss?command=DISPLAY&base=70036&RID=40361487 https://plus.cobiss.net/cobiss/sr/sr/bib/40361487#izum.si |
Projekat: | Ministry of Science and Technological Development of Republic of Serbia | M-kategorija: | 22M22 - Međunarodni časopis kategorije M22 |
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